Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

Our goal is to provide our customers with the best products with highest standard of service at cost efficient pricing

Introduction:

The Angstrom Advanced AXFQ series flaw detectors are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on.The glass x-ray tube allows to get images of excellent quality and clarity.

Types and Specifications:

Type	Output Voltage (kv)	Input Power (kw)	Focal Spot Size (mm2)	Divergent Angle	Max. Penetrate Depth in Steel (mm)	Generator Weight (kg)	Generator Size (mm3)
AXFQ-1005	50~100	1.2	0.8 × 0.8	40°	8	11.1	190 × 190 × 520
AXFQ-1605	60~160	1.5	0.8 × 0.8	40°	19	15.2	225 × 225 × 585
AXFQ-2005	100~200	2.0	1.5 × 1.5	40 ± 5°	30	23	285 × 285 × 665
AXFQ-2505	150~250	2.5	2.0 × 2.3	40 ± 5°	40	35	320 × 320 × 730
AXFQ-3005	170~300	3.0	2.3 × 2.3	40 ± 5°	50	45.5	345 × 345 × 830
AXFQ-3205	180~320	3.2	2.5 × 2.3	40 ± 5°	55	45.5	345 × 345 × 830
AXFQ-3505	180~350	3.4	2.8 × 3.0	40 ± 5°	60	47	345 × 345 × 800

Angstrom Advanced AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube)

Our goal is to provide our customers with the best products with highest standard of service at cost efficient pricing

Introduction:

Angstrom Advanced AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate non destructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure.

Types and Specifications:

Type	Output Voltage (kv)	Input Power (kw)	Focal Spot Size (mm2)	Divergent Angle		Max. Penetrate Depth in Steel (mm)		Generator Weight (kg)	Generator Size (mm3)
				cone target	planar target	cone target	planar target
AXFH-1005	50~100	1.2	0.8 × 0.8	30±5°	25±5°	4	6	11.1	190 × 190 × 520
AXFH-1605	60~160	1.5	0.8 × 0.8	30±5°	25±5°	12	15	15.2	225 × 225 × 585
AXFH-2005	100~200	2.0	1.5 × 1.5	30±5°	25±5°	24	27	23	285 × 285 × 665
AXFH-2505	150~250	2.5	2.0 × 2.3	30±5°	25±5°	34	37	35	320 × 320 × 730
AXFH-3005	170~300	3.0	2.3 × 2.3	30±5°	25±5°	44	47	45.5	345 × 345 × 830
AXFH-3205	180~320	3.2	2.5 × 2.3	30±5°	25±5°	45	50	45.5	345 × 345 × 830
AXFH-3505	180~350	3.4	2.8 × 3.0	30±5°	25±5°	52	55	47	345 × 345 × 800

Angstrom Advanced Inc ADX-2700 X-ray Powder Diffraction Instrument

Our goal is to provide our customers with the best products with highest standard of service at cost efficient pricing

Introduction: ^

Angstrom Advanced ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

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Features: ^

	Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis, Crystallography, Texture analysis, Transmission, Thin film analysis.
	ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature. ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable.
	Angstrom Advanced AHTK 1000 high temperature attachment Automated variable temperature stage for X-ray diffraction measurements of materials at elevated temperatures (room temperature-1200°C). The stage may be operated in vacuum. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample.
	Angstrom Advanced ALTK-450 Variable temperature attachment Automated variable temperature stage for X-ray diffraction measurements of crystal structure (-193°C-450°C). The stage can be operated under liquid nitrogen cooling conditions.

Software: ^

General diffraction data processing by Angstrom Advanced: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.

• Qualitative Analysis: The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
• Quantitative Analysis: After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion)
• Plot and Export: The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
• Phase identification, structure analysis, Thin film analysis, stress investigation, Texture analysis are all available

Parts and Specifications: ^

X-ray Generator	Control mode	1kV/step, 1mA/step controlled by PC
	Rated output power	4 kW
	Tube voltage	10-60 kV 1kV continuously adjustable
	Tube current	5-80 mA continuously adjustable
	X-ray tube	Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2
	Stability	≤ 0.0005%  mains fluctuation
Goniometer	Goniometer	theta(θ)/theta(θ)
	Diffraction circle semi-diameter	285mm
	Scan range of θ	-3° to +160°
	Continuous scanning speed	0.006-96°/min
	Setting speed of angle	1500°/min
	Scan mode	θ-θ or θ, θ; Continuous or step scanning
	One way repeatability of θ	≤ 0.0002°
	precision of θd or θs	≤0.005°
	Minimal stepping angle	0.0001°
Record Unit	Counter	PC or SC
	Maximal CPS	5x10^6 CPS
	Proportion counter energy spectrum resolution	≤ 25%(PC), ≤ 50%(SC)
	Detectable high voltage	1500-2100 continuous tune
	High voltage of  the counter	differential or integral, automatic PHA, dead time emendation
ADX-DWZ	System detector stability	≤ 0.01%
	Micro Structure	Micro Structure analysis, +/-0.5nm
	Micro-Diffraction	Micro sample or area, 2nm-19 um
Integrated performance	Dispersion dosage	≤ 1μSv/h
	Integrated stability of the system	≤ 0.5%
	Dimension	1000 × 800 × 1640 mm

Angstrom Advanced ADX-2500 X-ray Diffraction Instrument

Our goal is to provide our customers with the best products with highest standard of service at cost efficient pricing

Introductions: ^

Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software, ADX-2500 is a diffraction system appealing to the practical requirements in many fields.

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Angstrom Advanced ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis (ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.

Features: ^

• Perfect incorporation of the hardware and software allows the ADX-2500 to perform different types of analysis for researchers from various fields.
• High precision of the diffraction angle measurement allows the ADX-2500 to obtain the more accurate data.
• Higher stability of the X-ray generator control system provides excellent measurement accuracy.
• Simple and effective design makes the ADX-2500 convenient for operation and user friendliness.

Software: ^

General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.

• Profile fitting and overlapped peeks separation
  With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain.
• Qualitative Analysis
  The Angstrom Advanced data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
• Quantitative Analysis
  After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion).
• Plot and Export
  The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.

Parts and Specifications: ^

X-ray Generator	Control mode	1kV/step, 1mA/step controlled by PC
	Rated output power	3 kW
	Tube voltage	10-60 kV
	Tube current	5-80 mA
	X-ray tube	Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2
	Stability	≤ 0.01%
Goniometer	Goniometer	vertical frame
	Diffraction circle semi-diameter	185mm
	Scan range of 2θ	-15°-164°
	Continuous scanning rate	0.06°-76.2°/min
	Setting speed of angle	120°/min
	Scan mode	θ-2θ linkage, θ,2θ one way: continuous or step scanning
	One way repeatability of 2θ	≤ 0.001°
	Minimal stepping angle	0.001°
	Precision of 2θ	≤ 0.005°
Record Unit	Counter	PC or SC
	Maximal CPS	5×106 CPS
	Proportion counter energy spectrum resolution	≤ 25%(PC), ≤ 55%(SC)
	Detectable high voltage	1500-2100 V continuous tune
	High voltage of the counter	differential or integral, automatic PHA, dead time emendation
	System detector stability	≤ 0.01%
Integrated performance	Dispersion dosage	≤ 1μSv/h
	Integrated stability of the system	≤ 0.5%
	Dimension	1000 × 800 × 1640 mm

Angstrom Advanced AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

Our goal is to provide our customers with the best products with highest standard of service at cost efficient pricing

Introduction:

The Angstrom Advanced Inc. AXFG series detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tubes are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, the Angstrom Advanced AXFG X-ray flaw detector is the best choice for most applications.

Models and Specifications:

Type	Output Voltage (kv)	Input Power (kw)	Focal Spot Size (mm2)	Divergent Angle	Max. Penetrate Depth in Steel (mm)	Generator Weight (kg)	Generator Size (mm3)
AXFG-1605	60~160	1.5	0.8 × 0.8	40±5°	19	14.5	225 × 225 × 550
AXFG-2005	100~200	2.0	2.0 × 2.0	40 ± 5°	30	18	285 × 285 × 615
AXFG-2505	150~250	2.5	2.0 × 2.0	40 ± 5°	40	30.5	320 × 320 × 640
AXFG-3005	170~300	3.0	2.5 × 2.5	40 ± 5°	50	36.5	345 × 345 × 670