Technology

Angstrom Advanced Tech Base: X-ray Diffraction

Navigate This Page:

• Introduction:
  • How does X-ray Powder Diffraction Work?
  • Bragg's Law
  • What Can We Do with XRD?
• ADX-2500 X-ray Diffraction Instrument:
  • Introduction
  • Features
  • Software
  • Parts and Specifications
• ADX-2700 X-ray Powder Diffraction Instrument:
  • Introduction
  • Features
  • Software
  • Parts and Specifications

The Angstrom Advanced Inc XRD lineup includes technologies such as:

• Standard X-ray diffraction equipment
• Portable directional X-ray flaw detection (with glass x-ray tube)
• Portable panoramic X-ray flaw detection (with glass x-ray tube)
• Portable X-ray flaw detection (with rippled ceramic x-ray tube)

Introduction: ^

What are X-rays?

X-rays are electromagnetic waves of high energy and short wavelengths. The nature of their small wavelengths (on the order of less than 10 nanometers) enables them to take advantage of molecular spacing within solid matter in order to pass through many solid materials in question. They originate from inside energy shells of atoms and are produced when fast moving electrons slam into a metal object. The kinetic energy of the electron is transformed into electromagnetic energy.

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There are four basic components of an X-ray diffractometer by Angstrom Advanced: An x-ray tube, a sample holder, an X-ray detector, and a liquid nitrogen supply tube.

How does X-ray Powder Diffraction work? ^

When a monochromatic x-ray beam with wavelength l is incident on the lattice planes in a crystal planes in a crystal at an angle q, diffraction occurs only when the distance traveled by the rays reflected from successive planes differs by a complete number n of wavelengths. By varying the angle q, the Bragg’s Law conditions are satisfied by different d-spacing in poly-crystalline materials. Plotting the angular positions and intensities of the resultant diffraction peaks produces a pattern which is characterized of the sample. Where a mixture of different phases is present, the diffractogram is formed by addition of the individual patterns.

Bragg's Law: ^

For parallel planes of atoms, with a space dhkl between them, constructive interference only occurs when Bragg’s law is satisfied. The X-ray wavelength ƛ is fixed. Each plane of atoms produces a diffraction peak at a specific angle q. The direction perpendicular to the planes must bisect the incident and diffracted beams.

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What can we do with XRD? ^

• Identify phase composition
• Measure unit cell lattice parameters
• Estimate crystallite size, microstrain, and defect concentration
• Measure residual stress
• Measure texture and/or epitaxy
• Evaluate thin film quality
• Measure multilayer thin film thickness, roughness, and density
• Determine orientation of single crystals
• Solve or refine crystal structures
• Analyze ordered meso- and nanostructures

Angstrom Advanced ADX-2500 X-ray Diffraction Instrument: ^

Introduction: ^

Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software, ADX-2500 is a diffraction system appealing to the practical requirements in many fields.

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Angstrom Advanced ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis (ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.

Features: ^

• Perfect incorporation of the hardware and software allows the ADX-2500 to perform different types of analysis for researchers from various fields.
• High precision of the diffraction angle measurement allows the ADX-2500 to obtain the more accurate data.
• Higher stability of the X-ray generator control system provides excellent measurement accuracy.
• Simple and effective design makes the ADX-2500 convenient for operation and user friendliness.

Software: ^

General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.

• Profile fitting and overlapped peeks separation
  With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain.
• Qualitative Analysis
  The Angstrom Advanced data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
• Quantitative Analysis
  After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion).
• Plot and Export
  The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.

Parts and Specifications: ^

X-ray Generator	Control mode	1kV/step, 1mA/step controlled by PC
	Rated output power	3 kW
	Tube voltage	10-60 kV
	Tube current	5-80 mA
	X-ray tube	Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2
	Stability	≤ 0.01%
Goniometer	Goniometer	vertical frame
	Diffraction circle semi-diameter	185mm
	Scan range of 2θ	-15°-164°
	Continuous scanning rate	0.06°-76.2°/min
	Setting speed of angle	120°/min
	Scan mode	θ-2θ linkage, θ,2θ one way: continuous or step scanning
	One way repeatability of 2θ	≤ 0.001°
	Minimal stepping angle	0.001°
	Precision of 2θ	≤ 0.005°
Record Unit	Counter	PC or SC
	Maximal CPS	5×106 CPS
	Proportion counter energy spectrum resolution	≤ 25%(PC), ≤ 55%(SC)
	Detectable high voltage	1500-2100 V continuous tune
	High voltage of the counter	differential or integral, automatic PHA, dead time emendation
	System detector stability	≤ 0.01%
Integrated performance	Dispersion dosage	≤ 1μSv/h
	Integrated stability of the system	≤ 0.5%
	Dimension	1000 × 800 × 1640 mm

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument: ^

Introduction: ^

Angstrom Advanced ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

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Features: ^

	Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis, Crystallography, Texture analysis, Transmission, Thin film analysis.
	ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature. ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable.
	Angstrom Advanced AHTK 1000 high temperature attachment Automated variable temperature stage for X-ray diffraction measurements of materials at elevated temperatures (room temperature-1200°C). The stage may be operated in vacuum. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample.
	Angstrom Advanced ALTK-450 Variable temperature attachment Automated variable temperature stage for X-ray diffraction measurements of crystal structure (-193°C-450°C). The stage can be operated under liquid nitrogen cooling conditions.

Software: ^

General diffraction data processing by Angstrom Advanced: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.

• Qualitative Analysis: The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
• Quantitative Analysis: After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion)
• Plot and Export: The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
• Phase identification, structure analysis, Thin film analysis, stress investigation, Texture analysis are all available

Parts and Specifications: ^

X-ray Generator	Control mode	1kV/step, 1mA/step controlled by PC
	Rated output power	4 kW
	Tube voltage	10-60 kV 1kV continuously adjustable
	Tube current	5-80 mA continuously adjustable
	X-ray tube	Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2
	Stability	≤ 0.0005%  mains fluctuation
Goniometer	Goniometer	theta(θ)/theta(θ)
	Diffraction circle semi-diameter	285mm
	Scan range of θ	-3° to +160°
	Continuous scanning speed	0.006-96°/min
	Setting speed of angle	1500°/min
	Scan mode	θ-θ or θ, θ; Continuous or step scanning
	One way repeatability of θ	≤ 0.0002°
	precision of θd or θs	≤0.005°
	Minimal stepping angle	0.0001°
Record Unit	Counter	PC or SC
	Maximal CPS	5x10^6 CPS
	Proportion counter energy spectrum resolution	≤ 25%(PC), ≤ 50%(SC)
	Detectable high voltage	1500-2100 continuous tune
	High voltage of  the counter	differential or integral, automatic PHA, dead time emendation
ADX-DWZ	System detector stability	≤ 0.01%
	Micro Structure	Micro Structure analysis, +/-0.5nm
	Micro-Diffraction	Micro sample or area, 2nm-19 um
Integrated performance	Dispersion dosage	≤ 1μSv/h
	Integrated stability of the system	≤ 0.5%
	Dimension	1000 × 800 × 1640 mm