| Angstrom Advanced AA5000 Scanning Probe Microscope is our most innovative model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing. AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system. |
Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
- SPM can be in liquid;
- Real-time temperature and humidity detecting;
Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
- Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
- Fast automatically tip-engaging
- Simply change of the tip holder to switch between STM and AFM;
- Full digital control, auto system status recognition;
- Adjustable lightening inside
- With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
- Controller and Computer connected through a 10M/100M Fast Ethernet;
Large sample size: up to diameter 45mm, 30mm thick;
- Online Control Software and offline Image Processing Software for Windows;
- Trace-Retrace scan, Back-Forward scan;
- Online real-time 3D image;
- Automatically Brightness and Contrast refresh;
- Data can be loaded out for further analysis;
- Nano-Movie function: Continuous data collection, storage and replay;
Multi-Analysis: Granularity and Roughness;
- Tip Estimation and Image Re-construction;
- Modularized design for convenience of maintenance and future upgrade;
- Second display monitor and optical microscope system attachable;
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| Functions | Atomic Force Microscope (AFM) which has full coverage of Contacting Mode,
Tapping Mode, Phase Imaging and Lifting Mode;
Lateral Force Microscope (LFM);
Scanning Tunneling Microscope (STM);
Conductive AFM, SPM in liquid, Environmental Control SPM;
Nano-Processing System including Lithography Mode and Vector Scan Mode; |
| Resolution | AFM: 0.26nm lateral, 0.1nm vertical;
STM: 0.13nm lateral, 0.01nm vertical; |
| TechnicalParameters | Current Sensitivity: less than or equal to 10pA;
Force Sensitivity: less than or equal to 5pN;
Image Pixels: 128×128, 256×256, 512×512, 1024×1024, 2048×2048;
Scan Angle: 0-360 degree adjustable;
Scan Rate: 0.1-100Hz adjustable;
Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V;
Temperature Sensitivity: 0.1Celsius, Humidity Sensitivity: 0.5%RH;
Sample Size: Up to 50mmx50mm, 30mm thick;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm;
Online Control Software and offline Image Processing Software for Windows
Vista/XP/2000/9x; |
| Electronics | CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
DAC: 20 channels of 16-bit DAC;
ADC: 20 channels of 16-bit ADC;
Communication Interface: 10M/100M Fast Ethernet;
https://angstromadvancedblog.wordpress.com/2014/01/13/angstrom-advanced-aa5000-multi-function-spm-systems/ |
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